Measurement of tropospheric HO2 radical using fluorescence assay by gas expansion with low interferences
Wenqing Liu
,
Wenqing Liu
X
- Search for articles by this author
Affiliations
- Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, Anhui, China
Yihui Wang
,
Yihui Wang
X
- Search for articles by this author
Affiliations
- School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, Anhui, China;Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, Anhui, China
Renzhi Hu
,
Renzhi Hu
X
- Search for articles by this author
Affiliations
- Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, Anhui, China
Pinhua Xie
,
Pinhua Xie
X
- Search for articles by this author
Affiliations
- Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, Anhui, China;CAS Center for Excellence in Regional Atmospheric Environment, Institute of Urban Environment, Chinese Academy of Sciences, Xiamen 361000, Fujian, China;University of Chinese Academy of Sciences, Beijing 100049, Beijing, China
Hao Chen
,
Hao Chen
X
- Search for articles by this author
Affiliations
- Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, Anhui, China
Fengyang Wang
,
Fengyang Wang
X
- Search for articles by this author
Affiliations
- Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, Anhui, China
Xiaoyan Liu
,
JianGuo Liu
JianGuo Liu
X
- Search for articles by this author
Affiliations
- Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, Anhui, China
DOI:
10.1016/j.jes.2020.06.010
Received November 16, 2019,Revised , Accepted June 05, 2020, Available online June 28, 2020
Volume 33,2021,Pages 40-50